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BEGIN:VEVENT
UID:20260430T195044Z - 62884@eupp283
DTSTART;TZID=Europe/Amsterdam:20250417T090000
DTEND;TZID=Europe/Amsterdam:20250417T170000
CREATED:20260430T195044Z
DESCRIPTION:<a href="https://www.fast-micro.com/event/clean-event-2025-21">
 Clean Event 2025</a>\nJoin Fastmicro at Clean Event 2025 We’re excited t
 o personally invite you to meet us at Clean Event 2025 on April 17! Discov
 er the latest advancements in particle detection and continuous monitoring
  for cleanliness validation. Our solutions enable faster\, more efficient 
 contamination root-cause analysis and quality control in manufacturing pro
 cesses. This is also a great opportunity to reconnect\, exchange insights\
 , and explore how our technologies can further support your contamination 
 control needs. Join Our Lecture at Clean Event 2025 Time: 15:15 – 15:40 
 Location: Clean 5 Topic: "Advancements in Submicron Particle Contamination
  Measurements and Characterization for Contamination Root-Cause Analysis a
 nd Scalable Cleanliness Control in Supply Chains" Speaker: Bart Dirkx\, CO
 O\, Fastmicro B.V. The central theme of Clean Event 2025: Gaining control 
 over cleanliness and contamination control throughout the manufacturing pr
 ocess The Clean Event connects professionals from the entire chain around 
 industrial cleanliness to tackle challenges together\, share knowledge\, a
 nd exchange experiences. Here\, you will meet suppliers of industrial clea
 ning services\, systems\, and products focused on: Wet cleaning processesT
 hermal cleaning processesSpecial cleaning processes and applicationsMechan
 ical cleaning processesCleanrooms and supplies Book a M​eeting Now
DTSTAMP:20260430T195044Z
LOCATION:NH Conference Centre Koningshof\, Veldhoven
SUMMARY:Clean Event 2025
X-ALT-DESC;FMTTYPE=text/html:<a href="https://www.fast-micro.com/event/clea
 n-event-2025-21">Clean Event 2025</a>\nJoin Fastmicro at Clean Event 2025 
 We’re excited to personally invite you to meet us at Clean Event 2025 on
  April 17! Discover the latest advancements in particle detection and cont
 inuous monitoring for cleanliness validation. Our solutions enable faster\
 , more efficient contamination root-cause analysis and quality control in 
 manufacturing processes. This is also a great opportunity to reconnect\, e
 xchange insights\, and explore how our technologies can further support yo
 ur contamination control needs. Join Our Lecture at Clean Event 2025 Time:
  15:15 – 15:40 Location: Clean 5 Topic: "Advancements in Submicron Parti
 cle Contamination Measurements and Characterization for Contamination Root
 -Cause Analysis and Scalable Cleanliness Control in Supply Chains" Speaker
 : Bart Dirkx\, COO\, Fastmicro B.V. The central theme of Clean Event 2025:
  Gaining control over cleanliness and contamination control throughout the
  manufacturing process The Clean Event connects professionals from the ent
 ire chain around industrial cleanliness to tackle challenges together\, sh
 are knowledge\, and exchange experiences. Here\, you will meet suppliers o
 f industrial cleaning services\, systems\, and products focused on: Wet cl
 eaning processesThermal cleaning processesSpecial cleaning processes and a
 pplicationsMechanical cleaning processesCleanrooms and supplies Book a M
 ​eeting Now
END:VEVENT
END:VCALENDAR