BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//PYVOBJECT//NONSGML Version 1//EN
BEGIN:VTIMEZONE
TZID:Europe/Amsterdam
BEGIN:STANDARD
DTSTART:20001029T030000
RRULE:FREQ=YEARLY;BYDAY=-1SU;BYMONTH=10
TZNAME:CET
TZOFFSETFROM:+0200
TZOFFSETTO:+0100
END:STANDARD
BEGIN:DAYLIGHT
DTSTART:20000326T020000
RRULE:FREQ=YEARLY;BYDAY=-1SU;BYMONTH=3
TZNAME:CEST
TZOFFSETFROM:+0100
TZOFFSETTO:+0200
END:DAYLIGHT
END:VTIMEZONE
BEGIN:VEVENT
UID:20260526T072002Z - 39633@eupp283
DTSTART;TZID=Europe/Amsterdam:20250223T093000
DTEND;TZID=Europe/Amsterdam:20250227T173000
CREATED:20260526T072002Z
DESCRIPTION:<a href="https://www.fast-micro.com/event/spie-advanced-lithogr
 aphy-22">SPIE Advanced Lithography</a>\nJoin Fastmicro at SPIE Advanced Li
 thography + Patterning 2025 Event Overview: SPIE Advanced Lithography + Pa
 tterning is the premier global conference for professionals in lithography
 \, metrology\, and EUV technology. The event brings together industry lead
 ers\, researchers\, and engineers to address the latest challenges and adv
 ancements in semiconductor patterning technologies and materials. Event Hi
 ghlights:2\,200+ attendees from across the industry50+ exhibitors showcasi
 ng cutting-edge technologies500+ technical papers from leading researchers
 Expert-led courses to keep you and your team up to date Key Topics Covered
 :Optical and EUV NanolithographyDTCO and Computational PatterningMetrology
 \, Inspection\, and Process ControlNovel Patterning TechnologiesAdvances i
 n Patterning Materials and ProcessesAdvanced Etch Technology and Process I
 ntegration for Nanopatterning Visit Fastmicro If you’re attending SPIE A
 dvanced Lithography + Patterning\, we invite you to visit Fastmicro at Boo
 th during the exhibition on Tuesday and Wednesday. We will be showcasing o
 ur latest advancements in surface particle inspection\, designed to suppor
 t defect reduction and yield improvement through earlier in-process contam
 ination control. Join Our Poster Session We’re also presenting a poster 
 session on Wednesday evening\, where we will introduce an accelerated work
 flow for particle root-cause analysis in cleanliness validation of critica
 l parts and tool surfaces. Let’s Connect! If contamination control is a 
 key focus for you\, we’d love to discuss how our solutions can support y
 our needs. Feel free to stop by our booth or schedule a meeting with our t
 eam during the conference. We look forward to seeing you in San Jose! Book
  a M​eeting Now
DTSTAMP:20260526T072002Z
SUMMARY:SPIE Advanced Lithography
X-ALT-DESC;FMTTYPE=text/html:<a href="https://www.fast-micro.com/event/spie
 -advanced-lithography-22">SPIE Advanced Lithography</a>\nJoin Fastmicro at
  SPIE Advanced Lithography + Patterning 2025 Event Overview: SPIE Advanced
  Lithography + Patterning is the premier global conference for professiona
 ls in lithography\, metrology\, and EUV technology. The event brings toget
 her industry leaders\, researchers\, and engineers to address the latest c
 hallenges and advancements in semiconductor patterning technologies and ma
 terials. Event Highlights:2\,200+ attendees from across the industry50+ ex
 hibitors showcasing cutting-edge technologies500+ technical papers from le
 ading researchersExpert-led courses to keep you and your team up to date K
 ey Topics Covered:Optical and EUV NanolithographyDTCO and Computational Pa
 tterningMetrology\, Inspection\, and Process ControlNovel Patterning Techn
 ologiesAdvances in Patterning Materials and ProcessesAdvanced Etch Technol
 ogy and Process Integration for Nanopatterning Visit Fastmicro If you’re
  attending SPIE Advanced Lithography + Patterning\, we invite you to visit
  Fastmicro at Booth during the exhibition on Tuesday and Wednesday. We wil
 l be showcasing our latest advancements in surface particle inspection\, d
 esigned to support defect reduction and yield improvement through earlier 
 in-process contamination control. Join Our Poster Session We’re also pre
 senting a poster session on Wednesday evening\, where we will introduce an
  accelerated workflow for particle root-cause analysis in cleanliness vali
 dation of critical parts and tool surfaces. Let’s Connect! If contaminat
 ion control is a key focus for you\, we’d love to discuss how our soluti
 ons can support your needs. Feel free to stop by our booth or schedule a m
 eeting with our team during the conference. We look forward to seeing you 
 in San Jose! Book a M​eeting Now
END:VEVENT
END:VCALENDAR