BEGIN:VCALENDAR VERSION:2.0 PRODID:-//PYVOBJECT//NONSGML Version 1//EN BEGIN:VTIMEZONE TZID:Europe/Amsterdam BEGIN:STANDARD DTSTART:20001029T030000 RRULE:FREQ=YEARLY;BYDAY=-1SU;BYMONTH=10 TZNAME:CET TZOFFSETFROM:+0200 TZOFFSETTO:+0100 END:STANDARD BEGIN:DAYLIGHT DTSTART:20000326T020000 RRULE:FREQ=YEARLY;BYDAY=-1SU;BYMONTH=3 TZNAME:CEST TZOFFSETFROM:+0100 TZOFFSETTO:+0200 END:DAYLIGHT END:VTIMEZONE BEGIN:VEVENT UID:20260526T140238Z - 21654@eupp283 DTSTART;TZID=Europe/Amsterdam:20260212T090000 DTEND;TZID=Europe/Amsterdam:20260212T170000 CREATED:20260526T140238Z DESCRIPTION:VCCN Cleanliness Day\nMany high-tech products are highly sensitive to particle\, chemical\, and molecular contamination. As a result\, more organizations invest in cleanrooms. But a cleanroom alone does not guarant ee a clean product. Cleanliness control is a complex\, end-to-end challeng e that goes far beyond controlled environments. It requires clear specific ations\, effective and repeatable cleaning steps\, cross-functional awaren ess\, and—most importantly—measuring what truly matters. Following the success of previous editions\, VCCN Cleanliness Day 2026 brings together experts from industry\, research\, and technology to share practical insig hts on achieving\, measuring\, and maintaining cleanliness throughout the production process.What to expect This full-day event features lectures an d presentations on: Current developments in cleanliness and contamination control Best practices and innovative measurement techniques Practical dec ision-making for investments in cleanliness Speakers from Nikhef\, Apleona \, Brookhuis\, Fastmicro\, Meilink\, AAE\, ASML\, and others will cover to pics such as: Clean build principles Key product cleanliness aspects Parti cle cleanliness of product surfaces: how and why to measure Cleanliness in the supply chain Clean assembly processes And more Fastmicro at VCCN Clea nliness Day Fastmicro will be present to demonstrate how manufacturers can move beyond assumptions and visual checks toward quantitative\, repeatabl e\, and data-driven cleanliness control. During the event\, Fastmicro Appl ication Engineer Maarten Bouwman will present why a cleanroom does not aut omatically result in a clean product. The presentation will explore method s to quantify and qualify particle cleanliness on product surfaces\, inclu ding insights into ISO 14644-9:2022\, the standard for surface cleanliness classification. If your organization wants to manage cleanliness based on measurable data\, [...] DTSTAMP:20260526T140238Z LOCATION:High Tech Campus Eindhoven SUMMARY:VCCN Cleanliness Day X-ALT-DESC;FMTTYPE=text/html:VCCN Cleanliness Day\nMany high-tech products are highly sensitive to particle\, chemical\, and molecular contamination. As a result\, more organizations invest in cleanrooms. But a cleanroom alone does not guarantee a clean product. Cleanliness control is a complex\, en d-to-end challenge that goes far beyond controlled environments. It requir es clear specifications\, effective and repeatable cleaning steps\, cross- functional awareness\, and—most importantly—measuring what truly matte rs. Following the success of previous editions\, VCCN Cleanliness Day 2026 brings together experts from industry\, research\, and technology to shar e practical insights on achieving\, measuring\, and maintaining cleanlines s throughout the production process.What to expect This full-day event fea tures lectures and presentations on: Current developments in cleanliness a nd contamination control Best practices and innovative measurement techniq ues Practical decision-making for investments in cleanliness Speakers from Nikhef\, Apleona\, Brookhuis\, Fastmicro\, Meilink\, AAE\, ASML\, and oth ers will cover topics such as: Clean build principles Key product cleanlin ess aspects Particle cleanliness of product surfaces: how and why to measu re Cleanliness in the supply chain Clean assembly processes And more Fastm icro at VCCN Cleanliness Day Fastmicro will be present to demonstrate how manufacturers can move beyond assumptions and visual checks toward quantit ative\, repeatable\, and data-driven cleanliness control. During the event \, Fastmicro Application Engineer Maarten Bouwman will present why a clean room does not automatically result in a clean product. The presentation wi ll explore methods to quantify and qualify particle cleanliness on product surfaces\, including insights into ISO 14644-9:2022\, the standard for su rface cleanliness classification. If your organization wants to manage cle anliness based on measurable data\, [...] END:VEVENT END:VCALENDAR