Particle measurements
at microscale.
Cleanliness Control
Fast, accurate, quantitative surface particle measurements, so you can control cleanliness with confidence. Product after product, process after process.
Confident in
Particle
Contamination Control
Measure surface particle contamination to ISO 14644-9, and process deposition to ISO 14644-17, at sub-micron scale, on real product and process surfaces. Quantitative, repeatable, qualified results.
Reducing yield loss
We empower quality & performance, in less time
Fastmicro enables process and quality engineers to make reliable particle contamination decisions early, and to prove cleanliness improvements sooner. This leads to reduced yield loss, more uptime, and better-performing equipment.
Designed around one DNA
Every Fastmicro system is engineered the same way: measurements in seconds, objective digital output, operator-independent by design. Fast, quantified, easy to operate. Built in, not bolted on.
With our technology we enable our customers to be in control of demanding quality and cleanliness requirements of the microtechnology industries.
● solutions
We empower fast and accurate cleanliness control.
● knowledge base
Facing contamination challenges?
Check our knowledge base.
We share practical knowledge and real use cases to help you understand your contamination problem at the source.
Correlation between
particle contamination and yield loss
Particle contamination is a significant and well-documented cause of yield loss in semiconductor fabrication, composite aerospace manufacturing, and superconducting accelerator components. The particles involved are often microscopic, and they can enter the process from people, equipment, materials, and the environment.
How to
reduce yield loss
Leading
organizations in a.o. semiconductor fabrication, aerospace manufacturing and
big-science facilities share one approach: they treat surface cleanliness as a
measurable, controlled parameter rather than an assumption.
How particles
move in a cleanroom
Contamination doesn't just float — it settles, accumulates, and threatens your process. Discover how three complementary measurements, from airborne counts to surface inspection, reveal the full contamination story your cleanroom is telling.
A new method for measuring
contamination on cleanroom gloves
Tape-lift sampling with the Fastmicro Sample Scanner as a fast, localized alternative to liquid particle counting.
People are the largest contamination source inside a cleanroom, and gloves are the barrier between them and the product.
This is our DNA.
Fast
Imaging in seconds, results in under a minute. The same pace when you need an answer or an engineer.
Quantified
Numbers instead of opinions: objective digital output in our measurements, and the same clarity in our specs and commitments.
Easy to operate
Operator-independent by design, and a company
that's just as easy to work with.
Accurate
Calibrated from 0.5 µm on NIST-certified PSL particles. Carefulness is a core value; it shows in everything we build and do.
Consistent
Reproducible measurements, time after time, from
our systems and from our people.
High throughput
Measurement without interrupting production;
support without slowing you down.
● products
Making better decisions faster
with fast, accurate and quantitative particle measurements.
How to be in control of demanding quality and cleanliness requirements of the microtechnology industries - including semiconductor manufacturing, microelectronics, photonics, and other sectors, where even the smallest contaminants can impact performance or yield.
Our systems are in daily use with leading lithography and precision-optics manufacturers, across three continents.
Parts Qualification
Deposition Monitoring
Wafer Inspection & other substrates
Upgrade Kits & other accessories
cleanliness project manager,
leading Dutch semiconductor OEM:
"We have confidence in the Fastmicro scanner to help us with finding an excellent quantification of the surface cleanliness of critical parts."
What our
customers say.
Their success stories reflect our commitment
to excellence in particle measurement and cleanliness control.
