Surface particle measurements at microscale
Cleanliness Control

We enable cleanliness control according to 6 principles
Fast
Quantitative
Easy to Operate
Accurate
Consistent
High Throughput
Imaging in seconds
Measurement and qualification reports
Operator independent
High-resolution measurement (quantity, position, size)
Objective measurements, time after time
Processing in less than a minute
Microtechnology
Our unique technology and modular approach allows for a variety of applications
Our Solutions
Discover Fastmicro
Are you ready for the next step in cleanliness control?