Fastmicro
How-To Videos

How To Sample Scanner

To add a fourth column, reduce the size of these ​

Sample Scanner | Control Your Cleanliness

The new standard in surface particle contamination measurements.

Fastmicro Sample Scanner and Witness Wafer Kit

Fastmicro Sample Scanner and Sampler

Fastmicro PFS Fallout Scanner

Fastmicro PFS and Witness Wafer Kit

Fastmicro Particle Fallout Scanner 

Sample Scanner | Control Your Cleanliness

The new standard in surface particle contamination measurements.

How To Sample Scanner

To add a fourth column, reduce the size of these ​

20210601 TNO ASML Peter Leunissen Contamination Control symposium

Peter Leunissen from ASML gives a state of the art overview on defectivity improvements from surface particles at the TNO contamination control conference.