Particle measurement according to norms and standards
Fastmicro products conform to particle measurement and cleanliness control, according to the norms and standards. Our commitment is reflected in our stringent quality policies and the rigorous certification of our products and processes.
Norms and Standards
ASML GSA 07 9410 Cleanliness
Particles: Grade 1
IMS Nanofabrication 120947085-08 Cleanliness requirements for parts & assemblies: PC3 & PC4
ISO 14644-17:2021 - Particle deposition rate applications
ISO 14644-9:2022 - Assessment of surface cleanliness for particle concentration
SEMI E195-0925 - Test Method Using Adhesive Replacement Substrates to Assess Particulate Surface Contamination on Critical Chamber Components
NASA 19960044619 - Contamination control engineering design guidelines for the aerospace community
ESA ECSS-Q-ST-70-01C Rev.1 – Cleanliness and contamination control (15 October 2025)
IEST STD-CC1246E - Product Cleanliness Levels - Applications, Requirements, and Determination (adopted by US aerospace mainly)
IEST-RP-CC005: Gloves and Finger Cots Used in Cleanrooms and Other Controlled Environments (Fastmicro added in new revision (releasing 2026-Q2)
ASTM E1216-21 – Standard Practice for Sampling for Particulate Contamination by Tape Lift
Contact Us to Learn More
If you have questions about our quality policies or need more information on our certifications, please reach out to us. Our team is ready to provide all the necessary details and support to help you understand the scope and implications of our compliance with standards and norms. Contact us today to learn more about how our commitment to quality ensures the best outcomes for your needs.