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| PARTICLE COUNTERS


Indirect Particle Measurement

Surface particle measurement at microscale using 'tape-lift' samplers.


Our Solutions 

Indirect Particle Measurement Solutions

Sample Scanner

Measure sub-micrometer surface particle contamination levels from 0.5 um and larger,  according to ISO 14644-9 and other standards. Scan indirect particle contamination samples from diverse product surfaces and assemblies in seconds.

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Sampler

The Particle Measurement Card or 'PMC'  is a surface particle contamination inspection sampler for indirect or 'tape-lift' particle collection and measurements of cumulative particle count, size and location down to 0.5 micrometer particles.

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FAST

QUANTITATIVE

EASY TO OPERATE

ACCURATE

CONSISTENT

HIGH THROUGHPUT

Knowledge Center

Calculator Tools

Utilize our versatile SCP Grade tool to calculate particle concentration levels and corresponding SCP Grade levels according to ISO 14644-9.

Sample Scanner | Control Your Cleanliness

ISO 14644-9 Standards

Read about Cleanliness Control explained and the guiding ISO 14644  standards.

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about anything related to our Indirect Particle Measurement Solutions.


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About us

Fastmicro enables process quality engineers to make reliable particle contamination control decisions on where and how to improve their cleanliness processes and deliver consistent quality products. And ultimately, achieve leading-edge equipment performance for their end users.



We help with reducing yield losses and keeping up with ever-increasing cleanliness requirements.

Connect with us
  • info@fast-micro.com
  • 31 (0)40 285 41 88  
  •      Spaarpot 3
  •        5667 KV Geldrop
  •        The Netherlands 
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