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Fastmicro

Sample Scanner

Surface particle cleanliness validation at microscale.


  Detection from 0.5 µm size PSL equivalent particles

  Surface cleanliness validation according to ISO 14644-9

  > 90% Pick-up efficiency | > 90% Repeatability | Results in Seconds


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C U S T O M E R   R E V I E W   |  "Fastmicro has transformed our inspection capability business significantly. Before migration to this new inspection tool, we saw a 50% variation in the particle count measurements. This is now reduced to less than 10% in combination with a particle detection limit that went down significantly by more than one order of magnitude to 0.5 micrometer. We have confidence in the Fastmicro scanner to help us with finding an excellent quantification of the surface cleanliness of critical parts.

As valued customer, I know that the integration of Fastmicro has allowed us to reach our required machine defectivity performance.

Besides accurate measurements, the tool offers ease of use and high throughput features. We appreciate the professional service and collaboration with Fastmicro to extend the capabilities of the tool further in the future."

Cleanliness project manager, 
leading Dutch semiconductor OEM

FAST

QUANTITATIVE

EASY TO OPERATE

ACCURATE

CONSISTENT

HIGH THROUGHPUT

Instruction: Fastmicro Sample Scanner with Sampler and Witness Wafer Kit

Sample Scanner and PMC 2.0

Fastmicro Sampler and Sampler Operator Tool

Particle Counting

The Fastmicro Sample Scanner is an inspection tool for indirect measurement of surface particle contamination down to 0.5 micrometer particles using innovative 'tape-lift' samplers. These samplers or PMC cards facilitate flexible sampling on a variety of surfaces, including those that are difficult to reach or are unusually rough, without leaving any measurable residue. Quick and efficient, the scanner analyzes samples within seconds over a sample area of 225 mm², ensuring immediate and accurate results.


The versatility of the Sample Scanner is enhanced with different sampler options, including the card sampler holder for indirect measurements and the 2” wafer holder for fallout measurements. This adaptability makes it suitable to test diverse situations across various industries, providing robust measurements and valuable insights into contamination levels.

Sample Scanner Applications

EQUIPMENT
ASSEMBLIES
PARTS
CLEANING

Measurement Workflow for the Fastmicro Sample Scanner

Particle sampling on parts and in assemblies is possible on flat, curved and cavity surfaces

1. Part particle sampling with PMC       

2. Particle detection and measurement  
3. Particle Count, Size, Position in Seconds   

Are you ready for the next step in cleanliness control?

Contact us and make your particle measurement in seconds.

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A closer Look at the Fastmicro Sample Scanner and Report Example

Sample Scanner | Control Your Cleanliness

The new standard in surface particle contamination measurements.

 Datasheet 


Fastmicro Sample Scanner 


Get access to the comprehensive Sample Scanner Datasheet 






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