Particle

Fallout Scanner

Monitor particle deposition rates at sub-micrometer levels in real-time and at the same cleanliness levels as your cleanroom classification.



  Deposition rate monitoring according to ISO 14644-17 Standards

  Measurement time-intervals of 10 seconds or greater

  Lower Detection Limit of 0.5 µm and up of PSL equivalent particles


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​​PFS - Particle Fallout Scanner Instructions

Fastmicro Particle Fallout Scanner

 Monitor particle deposition rates at sub-micrometer levels.

Fastmicro PFS and Witness Wafer Kit

The new standard in surface particle contamination measurements

Fallout Scanner for particle deposition rate monitoring

The Fastmicro Fallout Scanner has been developed to measure the particle deposition rate in any industry. It can be used in both vacuum as well as ambient environments.

The scanner module is also available as a white label solution for system integrators. 


Continuously measure where and when it matters.

The Fastmicro Fallout Scanner offers particle deposition rate monitoring with intervals in seconds. 

The particle deposition rate can be accurately measured starting at particles of just  0.5 µm. 


Combined with the easy to use software, we help our customers to view cleanliness measurements on surfaces instead of airborne-only. Not all particles remain airborne, as they could deposit on critical surfaces, impacting technical cleanliness. 


With the Particle Fallout Scanner, the actual deposition rate becomes clear and can be used for further cleanliness improvement.


 Datasheet

Download the comprehensive Particle Fallout Scanner Datasheet 

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