FM-W-PDS

Manual and automated for 4-6-8-12-Inch Wafers Datasheet


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Fastmicro PR-PDS

  • Fast: imaging in seconds on large surfaces
  • Quantified: fit for qualification and monitoring in both production and an R&D environment
  • Easy to operate: operator independent, automated and clean handling
  • Accurate: high-resolution measurement (quantity,
  • position, size)
  • Consistent: objective measurements, time after time
  • High throughput: processing within a minute