SEMICON® JAPAN
SEMICON® JAPAN
Dec 11–13, 2024 | Tokyo Big Sight
We are honored to invite you to visit our booth (#3622) at SEMICON Japan,
taking place from December 11 to 13, 2024.
Fastmicro will be showcasing the latest advancements in high-throughput surface particle inspection at sub-microscales, which can significantly enhance defectivity performance and yield.
Our scanners are currently being utilized by the world's leading Semicon lithography manufacturer and developed in collaboration with the metrology experts of TNO. These scanners can precisely measure particle deposition or particles on large surfaces (such as EUV pellicle/reticle and 6/8/12” wafer sizes) from both the top and bottom sides. If you are seeking a fast solution to visualize and quantify surface particle contamination for mitigation, Fastmicro can truly make a difference.
COME VIST US
NL Pavilion | Tokyo Big Sight East 3 | Booth #3622
We are thrilled to meet you this year!