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  • Particle Counters

    InDirect Particle measurement

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    Sampler

    Particle Defect Inspection

    Wafer Defect Inspection System Photomask Defect Inspection System

    particle Deposition Rate monitoring

    ​Particle Fallout ScannerHigh Vacuum - Particle Fallout Scanner
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Apr 16
CLEAN EVENT 2024
--NH Conference Centre Koningshof--
Registrations Closed
Jun 11
18TH SILICON SAXONY DAY
--Dresden International Airport--
Registrations Closed
Jun 12
HETEROGENEOUS SYSTEMS FOR THE INTELLIGENTLY CONNECTED ERA
--Hilton Dresden Hotel An der Frauenkirche 5 01067 Dresden Germany--
Registrations Closed
Jun 17
39th Mask and Lithography Conference 2024
--Grenoble, France--
Registrations Closed
Jul 09
SEMICON West 2024
--Moscone Center, San Francisco, USA--
Registrations Closed
Sep 04
SEMICON Taiwan 2024
NL Pavilion | Booth no. J2646 | TaiNEX Hall 1
--TaiNEX Hall 1 and 2, Taipei, Taiwan--
Registrations Closed
Sep 25
Cleanzone 2024
Hall 1.2 | E 18
Frankfurt am Main, Germany
Registrations Closed
Nov 12
SEMICON® EUROPA
Nov 12–15, 2024 | Messe Munchen
--MESSE MÜNCHEN--
Registrations Closed
Dec 11
SEMICON® JAPAN
Dec 11–13, 2024 | Tokyo Big Sight
--Tokyo Big Sight--
Registrations Closed
Feb 23
SPIE Advanced Lithography
Registrations Closed
Mar 26
SEMICON China 2025
--SNIEC, Shanghai--
Registrations Closed
Apr 17
Clean Event 2025
--NH Conference Centre Koningshof, Veldhoven--
Registrations Closed
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About us

Fastmicro enables process quality engineers to make reliable particle contamination control decisions on where and how to improve their cleanliness processes and deliver consistent quality products. And ultimately, achieve leading-edge equipment performance for their end users.


We help with reducing yield losses and keeping up with ever-increasing cleanliness requirements.

Connect with us
  • info@fast-micro.com
  • 31 (0)40 285 41 88  
  •      Spaarpot 3
  •        5667 KV Geldrop
  •        The Netherlands 
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