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Ask us how we can help you monitor the cleanliness of your products , processes and workspace

| Semicondufctor
A new method for measuring

contamination on cleanroom gloves

To meet strict cleanliness specifications, glove
manufacturers and end users must ensure 
reliable testing. While established methods like
LPC (Liquid Particle Counting) are effective,
alternative surface-based techniques can offer

faster results and deeper insights.

    Read more

| Semiconductor
A new method for measuring

contamination on cleanroom gloves

To meet strict cleanliness specifications, glove
manufacturers and end users must ensure 
reliable testing. While established methods like
LPC (Liquid Particle Counting) are effective,
alternative surface-based techniques can offer

faster results and deeper insights.

    Read more

| Semiconductor
A new method for measuring

contamination on cleanroom gloves

To meet strict cleanliness specifications, glove
manufacturers and end users must ensure 
reliable testing. While established methods like
LPC (Liquid Particle Counting) are effective,
alternative surface-based techniques can offer

faster results and deeper insights.

    Read more

| Semiconductor
A new method for measuring

contamination on cleanroom gloves


To meet strict cleanliness specifications, glove manufacturers and end users must ensure reliable testing. While established methods like LPC (Liquid Particle Counting) are effective, alternative surface-based techniques can offer faster results and deeper insights

    Read more

| Semicondufctor
A new method for measuring

contamination on cleanroom gloves

To meet strict cleanliness specifications, glove
manufacturers and end users must ensure 
reliable testing. While established methods like
LPC (Liquid Particle Counting) are effective,
alternative surface-based techniques can offer

faster results and deeper insights.

    Read more

| Semiconductor
A new method for measuring

contamination on cleanroom gloves

To meet strict cleanliness specifications, glove
manufacturers and end users must ensure 
reliable testing. While established methods like
LPC (Liquid Particle Counting) are effective,
alternative surface-based techniques can offer

faster results and deeper insights.

    Read more

| Semiconductor
A new method for measuring

contamination on cleanroom gloves

To meet strict cleanliness specifications, glove
manufacturers and end users must ensure 
reliable testing. While established methods like
LPC (Liquid Particle Counting) are effective,
alternative surface-based techniques can offer

faster results and deeper insights.

    Read more

| Semiconductor
A new method for measuring

contamination on cleanroom gloves


To meet strict cleanliness specifications, glove manufacturers and end users must ensure reliable testing. While established methods like LPC (Liquid Particle Counting) are effective, alternative surface-based techniques can offer faster results and deeper insights

    Read more

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About us

Fastmicro enables process quality engineers to make reliable particle contamination control decisions on where and how to improve their cleanliness processes and deliver consistent quality products. And ultimately, achieve leading-edge equipment performance for their end users.



We help with reducing yield losses and keeping up with ever-increasing cleanliness requirements.

Connect with us
  • info@fast-micro.com
  • 31 (0)40 285 41 88  
  •      Spaarpot 3
  •        5667 KV Geldrop
  •        The Netherlands 
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